The assesment of surface topograhy of zirconium oxide ceramic using Atomic Force Microscope (AFM)
نویسندگان
چکیده
منابع مشابه
Characterization of Metallic Nanowires by Combining Atomic Force Microscope (AFM) and Scanning Electron Microscope (SEM)
A new experimental method is introduced in order to characterize the mechanical properties of metallic nanowires. An accurate mechanical characterization of nanowires requires simultaneous imaging using scanning electron microscope (SEM) and mechanical testing with an atomic force microscope (AFM). In this study, an AFM is located inside an SEM chamber in order to establish the visibility of th...
متن کاملassessment of the efficiency of s.p.g.c refineries using network dea
data envelopment analysis (dea) is a powerful tool for measuring relative efficiency of organizational units referred to as decision making units (dmus). in most cases dmus have network structures with internal linking activities. traditional dea models, however, consider dmus as black boxes with no regard to their linking activities and therefore do not provide decision makers with the reasons...
the use of appropriate madm model for ranking the vendors of mci equipments using fuzzy approach
abstract nowadays, the science of decision making has been paid to more attention due to the complexity of the problems of suppliers selection. as known, one of the efficient tools in economic and human resources development is the extension of communication networks in developing countries. so, the proper selection of suppliers of tc equipments is of concern very much. in this study, a ...
15 صفحه اولRelative surface charge density mapping with the atomic force microscope.
An experimental approach for producing relative charge density maps of biological surfaces using the atomic force microscope is presented. This approach, called D minus D (D-D) mapping, uses isoforce surfaces collected at different salt concentrations to remove topography and isolate electrostatic contributions to the tip-sample interaction force. This approach is quantitative for surface poten...
متن کاملSimulations of the Frequency Modulated - Atomic Force Microscope (FM-AFM) Nonlinear Control System
The Frequency Modulated Atomic Force Microscope (FM-AFM) is a powerful tool to perform surface investigation with true atomic resolution. The control system of the FM-AFM must keep constant both the frequency and amplitude of oscillation of the microcantilever during the scanning process of the sample. However, tip and sample interaction forces cause modulations in the microcantilever motion. A...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Prosthodontics
سال: 2020
ISSN: 0033-1783,2391-601X
DOI: 10.5114/ps/127265